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Wolfspeed & Richardson RFPD Tech Chats Support Successful Integration of Silicon Carbide

2022-03-08T11:08:14-06:00March 8th, 2022|Categories: Featured, Tech Chat, Video, Wolfspeed|

Part of our Tech Chat series Find help with your Silicon Carbide questions. Wolfspeed and Richardson RFPD have developed a series of Tech Chats which comprise conversations between engineers on various SiC topics. SEE THE SERIES AT RICHARDSONRFPD.COM/WOLFSPEEDTECHCHAT

Tech Chat with Microchip: Threshold Voltage and Negative Bias

2021-11-08T12:22:34-06:00November 8th, 2021|Categories: Featured, Microchip, Tech Chat, Video|

Part of our Tech Chat series In this Tech Chat, we discuss a SiC MOSFET's threshold voltage and its importance on switching loss and immunity to noise and voltage spikes.Speakers:Steven Chenetz, Discrete and Power Management Field Applications Engineer, MicrochipKirk Barton, Field Applications Engineer, Richardson RFPD MORE TECH CHAT!

Tech Chat with Microchip: Avalanche Rating in SiC MOSFETs

2021-10-19T10:17:28-05:00September 13th, 2021|Categories: Featured, Microchip, Tech Chat, Video|

Part of our Tech Chat series What is avalanche and why does it occur? How does it affect reliability of a device? Why and how does Microchip emphasize avalanche testing in its SiC MOSFETs to enhance reliability? All questions are answered in this Tech Chat. MORE TECH CHAT!

Tech Chat with GaN Systems – Thermal design best practices for GaN-based high power density converters

2021-08-17T09:19:09-05:00August 17th, 2021|Categories: Featured, GaN Systems, Tech Chat, Video|

Part of our Tech Chat series Growing demand for more efficient power supply adapters has led to increasing adoption of GaN power devices in this market. These high density adapters require thermal optimization considerations. View our Tech Chat to learn more. MORE TECH CHAT!

Tech Chat with Analog Devices: Short Circuit Protection Using Isolated Gate Drivers

2021-08-09T15:23:10-05:00August 9th, 2021|Categories: Analog Devices, Featured, Tech Chat, Video|

Part of our Tech Chat series Gate drivers provide the first line of defense against short-circuit faults on power semiconductor devices. When comparing different types of power semiconductor technologies – IGBTs v. silicon carbide, for example – there are differences in the short circuit withstand capabilities. This Tech Chat discusses reasons for SiC module failure

Tech Chat with GaN Systems – Demystifying the GaN EMC Design Practice

2021-07-04T16:57:52-05:00July 4th, 2021|Categories: Featured, GaN Systems, Tech Chat, Video|

Part of our Tech Chat series Mitigating EMC in GaN power circuits does not require extra design efforts. In fact, the EMC performance and solutions of GaN are very similar to silicon MOSFETs. Learn more in this Tech Chat with GaN Systems. MORE TECH CHAT!

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